Large-Collection-Angle BF STEM Imaging of Compound Semiconductors
نویسندگان
چکیده
منابع مشابه
Stoichiometry and doping in large gap compound semiconductors
2014 Current theoretical models on self-compensation in large gap semiconductors assume that intrinsic stoichiometric defects dominate and explain electrical properties quite satisfactorily without any contribution from impurities. Some recent results show on the contrary that impurities are in fact dominant at least at room temperature. The paper, starting from one particular material (ZnTe), ...
متن کاملHydrogen in compound semiconductors
Hydrogen can be inadvertently introduced at any of several steps in the fabrication of optoelectronic devices. The most common consequence of hydrogenation is the passivation of dopant impurities, which leads to a decrease in the electrical conductivity of the material. The most successfully applied experimental technique for directly determining the involvement of hydrogen has been infrared-ab...
متن کاملEstimation of Plaque Contents With Multi-Angle 3D Compound Imaging
This investigation exploits the potential of using multiple insonification angles in characterizing plaques in the carotid artery. Specifically, previous work h a s shown that certain plaque materials such as lipid exhibit a low degree of angle-dependence in the received echo signal while the signal varies much more with angle forfibrous tissues. system h a s been established with a 10 MHz focu...
متن کاملTechnology Roadmaps for Compound Semiconductors
The roles cited for compound semiconductors in public versions of existing technology roadmaps from the National Electronics Manufacturing Initiative, Inc., Optoelectronics Industry Development Association, Microelectronics Advanced Research Initiative on Optoelectronic Interconnects, and Optoelectronics Industry and Technology Development Association (OITDA) are discussed and compared within t...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2015
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927615010387